Vlachos, D., Craven, A.J. and McComb, D.W. (2001) The influence of dopant concentration on the oxygen K-edge ELNES and XANES in yttria-stabilized zirconia. Journal of Physics: Condensed Matter, 13(48), 10799 -10809. (doi: 10.1088/0953-8984/13/48/306)
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Publisher's URL: http://dx.doi.org/10.1088/0953-8984/13/48/306
Abstract
The electron energy-loss near-edge structure (ELNES) and x-ray absorption near-edge structure (XANES) at the oxygen K-edge has been investigated in a range of yttria-stabilized zirconia (YSZ) materials. The positions of the peaks in the near-edge structure are identical in both techniques. Differences observed in the intensities of the features are attributed to the effect of specimen charging in the XANES experiments. Analysis of near-edge structure reveals that both the crystallographic phase and the metal fraction of yttrium present can be determined directly from the oxygen K-edge data opening up opportunities for characterization of interfacial phenomena in YSZ materials with sub-nanometre resolution using ELNES.
| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Craven, Professor Alan |
| Authors: | Vlachos, D., Craven, A.J., and McComb, D.W. |
| Subjects: | Q Science > QC Physics |
| College/School: | College of Science and Engineering > School of Physics and Astronomy |
| Journal Name: | Journal of Physics: Condensed Matter |
| ISSN: | 0953-8984 |
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