Dielectric Bragg mirrors for InGaN surface-emitting lasers

Martin, R.W., Kim, T., Burns, D., Watson, I.M., Dawson, M.D., Krauss, T.F., Marsh, J.H. , De La Rue, R.M. , Romani, S. and Kheyrandish, H. (1999) Dielectric Bragg mirrors for InGaN surface-emitting lasers. Physica Status Solidi A: Applications and Materials Science, 176(1), pp. 67-71. (doi:10.1002/(SICI)1521-396X(199911)176:1<67::AID-PSSA67>3.0.CO;2-L)

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Abstract

An approach to the fabrication of InGaN surface‐emitting lasers using lateral epitaxial overgrowth (LEO) on patterned dielectric Bragg mirrors is described. The properties of SiO2/ZrO2 mirrors, annealed to simulate LEO conditions, were investigated using reflectance spectroscopy, electron microscopy, sputtered neutral mass spectrometry, and X‐ray diffraction. The mirrors are shown to be sufficiently robust for the proposed application. We show that a blue‐shift of the reflectivity stop‐band during annealing can be pre‐compensated and that a slight reduction in peak reflectivity is related to the formation of crystallite microstructure within the ZrO2 layers.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Marsh, Professor John and De La Rue, Professor Richard
Authors: Martin, R.W., Kim, T., Burns, D., Watson, I.M., Dawson, M.D., Krauss, T.F., Marsh, J.H., De La Rue, R.M., Romani, S., and Kheyrandish, H.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Physica Status Solidi A: Applications and Materials Science
Publisher:Wiley
ISSN:1862-6300
ISSN (Online):1862-6319

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