Gallacher, K. et al. (2018) Components for Integrated Ge on Si for Mid-Infrared Photonic Sensors. In: 2018 IEEE Photonics Society Summer Topical Meeting Series (SUM), Waikoloa Village, HI, USA, 09-11 Jul 2018, pp. 177-178. ISBN 9781538653432 (doi: 10.1109/PHOSST.2018.8456761)
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Abstract
Components for mid-infrared chip-scale sensors are reviewed including loss measurements of Ge-on-Si waveguides between 8 and 10.5 μm wavelength. Third-harmonic generation is demonstrated using Ge nano-antennas. Such components are essential for a Ge-on-Si mid-infrared platform technology for healthcare, security and environmental sensing applications.
| Item Type: | Conference Proceedings |
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| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Millar, Dr Ross and Hawley, Mrs Ugne and Paul, Professor Douglas and Gallacher, Dr Kevin |
| Authors: | Gallacher, K., Millar, R. W., Griskeviciute, U., Fischer, M. P., Riede, A., Frigerio, J., Baldassarre, L., Pellegrini, G., Leitenstorfer, A., Brida, D., Isella, G., Ortolani, M., Biagioni, P., and Paul, D. J. |
| College/School: | College of Science and Engineering > School of Engineering College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| ISSN: | 2376-8614 |
| ISBN: | 9781538653432 |
| Published Online: | 06 September 2018 |
| Copyright Holders: | Copyright © 2018 IEEE |
| First Published: | First published in Proceedings of the 2018 IEEE Photonics Society Summer Topical Meeting Series (SUM): 177-178 |
| Publisher Policy: | Reproduced in accordance with the publisher copyright policy |
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