Scott, J. , McVitie, S. , Ferrier, R.P. and Gallagher, A. (2001) Electrostatic charging artefacts in Lorentz electron tomography of MFM tip stray fields. Journal of Physics D: Applied Physics, 34(9), 1326 -1332. (doi: 10.1088/0022-3727/34/9/307)
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Abstract
Using the technique of differential phase contrast (DPC) Lorentz electron microscopy, the magnetic stray field distribution from magnetic force microscopy (MFM) tips can be calculated in a plane in front of the tip using tomographic reconstruction techniques. Electrostatic charging of the tip during DPC imaging can significantly distort these field reconstructions. Using a simple point charge model, this paper illustrates the effect of electrostatic charging of the sample on the accuracy of tomographic field reconstructions. A procedure for separating electrostatic and magnetic effects is described, and is demonstrated using experimental tomographic data obtained from a modified MFM tip.
Item Type: | Articles |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Scott, Dr Jamie and McVitie, Professor Stephen and Ferrier, Prof Robert |
Authors: | Scott, J., McVitie, S., Ferrier, R.P., and Gallagher, A. |
Subjects: | Q Science > QC Physics |
College/School: | College of Science and Engineering > School of Physics and Astronomy |
Research Group: | Solid State Physics |
Journal Name: | Journal of Physics D: Applied Physics |
Publisher: | Institute of Physics |
ISSN: | 0022-3727 |
ISSN (Online): | 1361-6463 |
Copyright Holders: | Copyright © 2001 Institute of Physics |
First Published: | First published in Journal of Physics D: Applied Physics 34(9):1326-1332 |
Publisher Policy: | Reproduced in accordance with the copyright policy of the publisher |
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