Pozela, K., Pozela, J., Dapkus, L., Jasutis, V., Silenas, A., Smith, K.M. and Bendorius, R.A. (2001) Optical response of the graded-gap AlxGa1-xAs X-ray detector. Nuclear Instruments and Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment, 466(1), 58 -62. (doi: 10.1016/S0168-9002(01)00825-7)
Full text not currently available from Enlighten.
Publisher's URL: http://dx.doi.org/10.1016/S0168-9002(01)00825-7
Abstract
It has been observed that only a part of the AlxGa1-xAs graded- gap layer with the energy gap gradient g gt 20 eV/cm is active as a X-ray luminescence source. The thickness of the active layer is 30-50 mum. To increase the detectors optical response efficiency, the following methods are proposed and tested: 1. Reflection of the X-ray luminescence light, generated in the bulk AlxGa1-xAs layer, inside the total reflection angle theta; 2. Optical stimulation of the electron-hole radiative recombination.
Item Type: | Articles |
---|---|
Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Smith, Professor Kenway |
Authors: | Pozela, K., Pozela, J., Dapkus, L., Jasutis, V., Silenas, A., Smith, K.M., and Bendorius, R.A. |
Subjects: | Q Science > QC Physics |
College/School: | College of Science and Engineering > School of Physics and Astronomy |
Journal Name: | Nuclear Instruments and Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment |
Publisher: | Elsevier BV |
ISSN: | 0168-9002 |
ISSN (Online): | 1872-9576 |
University Staff: Request a correction | Enlighten Editors: Update this record