Optical response of the graded-gap AlxGa1-xAs X-ray detector

Pozela, K., Pozela, J., Dapkus, L., Jasutis, V., Silenas, A., Smith, K.M. and Bendorius, R.A. (2001) Optical response of the graded-gap AlxGa1-xAs X-ray detector. Nuclear Instruments and Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment, 466(1), 58 -62. (doi: 10.1016/S0168-9002(01)00825-7)

Full text not currently available from Enlighten.

Publisher's URL: http://dx.doi.org/10.1016/S0168-9002(01)00825-7

Abstract

It has been observed that only a part of the AlxGa1-xAs graded- gap layer with the energy gap gradient g gt 20 eV/cm is active as a X-ray luminescence source. The thickness of the active layer is 30-50 mum. To increase the detectors optical response efficiency, the following methods are proposed and tested: 1. Reflection of the X-ray luminescence light, generated in the bulk AlxGa1-xAs layer, inside the total reflection angle theta; 2. Optical stimulation of the electron-hole radiative recombination.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Smith, Professor Kenway
Authors: Pozela, K., Pozela, J., Dapkus, L., Jasutis, V., Silenas, A., Smith, K.M., and Bendorius, R.A.
Subjects:Q Science > QC Physics
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Nuclear Instruments and Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment
Publisher:Elsevier BV
ISSN:0168-9002
ISSN (Online):1872-9576

University Staff: Request a correction | Enlighten Editors: Update this record