In-Line Non-Destructive Characterisation Method for Photonic Crystal Surface Emitting Lasers

King, B. C., Taylor, R. J.E., Ivanov, P., Butler, I., Roberts, T. S., Childs, D. T.D. and Hogg, R. A. (2018) In-Line Non-Destructive Characterisation Method for Photonic Crystal Surface Emitting Lasers. In: 2018 IEEE International Semiconductor Laser Conference (ISLC), Santa Fe, NM, USA, 16-19 Sep 2018, pp. 165-166. ISBN 9781538664865 (doi:10.1109/ISLC.2018.8516218)

King, B. C., Taylor, R. J.E., Ivanov, P., Butler, I., Roberts, T. S., Childs, D. T.D. and Hogg, R. A. (2018) In-Line Non-Destructive Characterisation Method for Photonic Crystal Surface Emitting Lasers. In: 2018 IEEE International Semiconductor Laser Conference (ISLC), Santa Fe, NM, USA, 16-19 Sep 2018, pp. 165-166. ISBN 9781538664865 (doi:10.1109/ISLC.2018.8516218)

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Abstract

We present a method for the in-line non-destructive characterisation of photonic crystal surface emitting lasers. We show through photoluminescence measurement at the point of photonic crystal definition that the etch depth and fill factor can be determined through comparison to band structure modelling.

Item Type:Conference Proceedings
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Ivanov, Dr Pavlo and Taylor, Dr Richard and Butler, Mr Iain and Hogg, Professor Richard and Roberts, Timothy and King, Ben and Childs, Dr David
Authors: King, B. C., Taylor, R. J.E., Ivanov, P., Butler, I., Roberts, T. S., Childs, D. T.D., and Hogg, R. A.
College/School:College of Science and Engineering > School of Engineering
College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
ISSN:1947-6981
ISBN:9781538664865
Published Online:01 November 2018

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