Bandstructure approach to near edge structure

Paxton, A.T., Craven, A.J., Gregg, J.M. and McComb, D.W. (2003) Bandstructure approach to near edge structure. Journal of Microscopy, 210(1), 35 -44. (doi: 10.1046/j.1365-2818.2003.01182.x?journalCode=jmi&volume=210&issue=1)

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We review the current state of the art in EELS fingerprinting by computer simulation, focusing on the bandstructure approach to the problem. Currently calculations are made using a one electron theory, but we describe in principle the way to go beyond this to include final state effects. We include these effects within the one electron framework using the Slater transition state formula and assess the errors involved. Two examples are then given which illustrate the use of the one electron approximation within density functional theory. Our approach is to combine predicted atomic structure with predicted electronic structure to assist in fingerprinting of complex crystal structures.

Item Type:Articles
Glasgow Author(s) Enlighten ID:Craven, Professor Alan
Authors: Paxton, A.T., Craven, A.J., Gregg, J.M., and McComb, D.W.
Subjects:Q Science > QC Physics
Q Science > QH Natural history
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Journal of Microscopy

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