Elksne, M. , Al-Khalidi, A. and Wasige, E. (2018) AlGaN/GaN HEMT with Distributed Gate for Improved Thermal Performance. In: 2018 13th European Microwave Integrated Circuits Conference (EuMIC), Madrid, Spain, 23-25 Sep 2018, pp. 13-16. ISBN 9782874870521 (doi: 10.23919/EuMIC.2018.8539896)
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Abstract
This paper reports a novel type of distributed gate (DG) HEMT fabricated using isolation by oxygen plasma. The technique results in planar devices with low gate leakage currents of only 1.3 μA/mm at -20 V gate voltage for devices with gate periphery of 1 mm. The DG-HEMT improves the thermal performance by reducing the current drop at higher drain voltages leading to higher output powers.
Item Type: | Conference Proceedings |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Wasige, Professor Edward and Elksne, Mrs Maira and Al-Khalidi, Dr Abdullah |
Authors: | Elksne, M., Al-Khalidi, A., and Wasige, E. |
College/School: | College of Science and Engineering > School of Engineering College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
ISBN: | 9782874870521 |
Published Online: | 19 November 2018 |
Copyright Holders: | Copyright © 2018 EuMA |
First Published: | First published in Proceedings of the 2018 13th European Microwave Integrated Circuits Conference (EuMIC): 13-16 |
Publisher Policy: | Reproduced in accordance with the publisher copyright policy |
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