Murdoch, S.J.T., Chapman, J.N., Pokhil, T.G., Mao, S. and Murdock, E.S. (2000) Transmission electron microscopy study of thermal effects on the free-layer reversal of a crossed-anisotropy spin valve. Journal of Applied Physics, 87(9), 4945 -4947. (doi: 10.1063/1.373210)
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Publisher's URL: http://dx.doi.org/10.1063/1.373210
Abstract
Transmission electron microscopy has been used to study the reversal of the free layer of a NiMn-pinned crossed-anisotropy spin valve as a function of applied field orientation and specimen temperature. By choosing the orientation of the applied field correctly it was possible to avoid the formation of domains in the reversal process. As the temperature was raised above room temperature, the mechanism remained qualitatively unchanged until temperatures of approximate to 200 degrees C were reached, beyond which irreversible behavioral change began to take place. From analysis of image sequences magnetoresistance characteristics have been constructed.
| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | UNSPECIFIED |
| Authors: | Murdoch, S.J.T., Chapman, J.N., Pokhil, T.G., Mao, S., and Murdock, E.S. |
| Subjects: | Q Science > QC Physics |
| College/School: | College of Science and Engineering > School of Physics and Astronomy |
| Journal Name: | Journal of Applied Physics |
| ISSN: | 0021-8979 |
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