Quantitative field measurements from magnetic force microscope tips and comparison with point and extended charge models

McVitie, S. , Ferrier, R.P., Scott, J. , White, G.S. and Gallagher, A. (2001) Quantitative field measurements from magnetic force microscope tips and comparison with point and extended charge models. Journal of Applied Physics, 89(7), 3656 -3661. (doi:10.1063/1.1352031)

Full text not currently available from Enlighten.

Publisher's URL: http://dx.doi.org/10.1063/1.1352031

Abstract

In this article we present results and analysis from measurements of the field distributions from standard magnetic force microscope tips. These measurements are made using Lorentz microscopy and tomographic reconstruction techniques with the field reconstructed in a plane situated about 50 nm from the end of the magnetic force microscope (MFM) tip; this corresponds approximately to the sample plane in the MFM. By examination of the experimental results and comparison with simulated field distributions from point and extended charge distributions, we conclude that the magnetization configuration of the tip is best represented by an extended charge distribution and that the point pole approximation represents only, at best, the central part of the field distribution.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:McVitie, Professor Stephen and White, Dr Gary and Scott, Dr Jamie and Ferrier, Prof Robert
Authors: McVitie, S., Ferrier, R.P., Scott, J., White, G.S., and Gallagher, A.
Subjects:Q Science > QC Physics
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Journal of Applied Physics
ISSN:0021-8979

University Staff: Request a correction | Enlighten Editors: Update this record