Secrecy outage analysis for SIMO underlay cognitive radio networks over generalized-K fading channels

Lei, H., Zhang, H., Ansari, I. S. , Pan, G. and Qaraqe, K. (2016) Secrecy outage analysis for SIMO underlay cognitive radio networks over generalized-K fading channels. IEEE Signal Processing Letters, 23(8), pp. 1106-1110. (doi:10.1109/LSP.2016.2587323)

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Abstract

In this letter, we consider a single-input multiple-output cognitive wiretap system over generalized-K channels, where the eavesdropper overhears the transmission from the secondary transmitter (ST) to the legitimate receiver. Both the primary user and the ST are equipped with a single antenna, whereas the legitimate and the eavesdropper receivers are equipped with multiple antennas. The close-form expression for the secrecy outage probability is derived. Simulations are presented to validate the accuracy of our proposed analytical results.

Item Type:Articles
Additional Information:This work was supported in part by the National Natural Science Foundation of China under Grant 61471076 and Grant 61401372, in part by the Program for Changjiang Scholars and Innovative Research Team in University under Grant IRT1299, in part by the special fund of Chongqing Key Laboratory, Project of Fundamental and Frontier Research Plan of Chongqing (cstc2015jcyjBX0085), and in part by the Fundamental Research Funds for the Central Universities under Grant XDJK2015B023, and in part by the Chongqing Postgraduate Scientific Research and Innovation under Grant CYS16162. Parts of this publication, specifically Sections [II] and [III], were made possible by PDRA (PostDoctoral Research Award) Grant # PDRA1-1227-13029 from the Qatar National Research Fund (a member of Qatar Foundation)
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Ansari, Dr Imran
Authors: Lei, H., Zhang, H., Ansari, I. S., Pan, G., and Qaraqe, K.
College/School:College of Science and Engineering > School of Engineering
Journal Name:IEEE Signal Processing Letters
Publisher:Institute of Electrical and Electronics Engineers
ISSN:1070-9908
ISSN (Online):1558-2361
Published Online:07 July 2016

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