Thermally poled silica samples are structurally heterogeneous: Electron diffraction evidence of partial crystallization

Cabrillo, C., Bermejo, F.J., Gibson, J.M., Johnson, J.A., Faccio, D. , Pruneri, V. and Kazansky, P.G. (2001) Thermally poled silica samples are structurally heterogeneous: Electron diffraction evidence of partial crystallization. Applied Physics Letters, 78(14), pp. 1991-1993. (doi:10.1063/1.1359776)

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Abstract

Large structural modifications in v-SiO2 are found to be induced by “thermal poling,” a treatment which makes the glass act as a frequency doubler of an impinging infrared light. The electron diffraction patterns of poled silica plates reveal the presence of a large amount (of order 10%) of crystallites showing patterns consistent with partial crystallization of the glassy matrix into the cristobalite polymorph of silica.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Faccio, Professor Daniele
Authors: Cabrillo, C., Bermejo, F.J., Gibson, J.M., Johnson, J.A., Faccio, D., Pruneri, V., and Kazansky, P.G.
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Applied Physics Letters
Publisher:AIP Publishing
ISSN:0003-6951
ISSN (Online):1077-3118

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