Lim, C.K., Chapman, J.N., Rahman, M., Johnston, A. and O'Donnell, D.O. (2004) Lorentz microscopy studies of the variation with temperature and processing conditions of free layer reversal mechanisms in spin valves. Journal of Applied Physics, 95(3), 1510 -1515. (doi: 10.1063/1.1626795)
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Publisher's URL: http://dx.doi.org/10.1063/1.1626795
Abstract
The reversal process of the free layer of two spin valves (SVs) with crossed anisotropy was studied as a function of temperature by transmission electron microscopy. In situ magnetizing experiments were carried out using the Fresnel imaging mode at room temperature, 100 degreesC, and 200 degreesC. The two SVs studied had slightly different synthetic antiferromagnetic (SAF) structures, the magnetic layers being thicker in one than the other. It was found that the SV with the thinner SAF layer was less thermally stable. Moreover, a change in the reversal process was observed at elevated temperature while no changes were seen for the SV with thicker SAF. Insight into why the reversal mode varied in the way it did was obtained using a modified Stoner-Wohlfarth model.
| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | O'Donnell, Dr David |
| Authors: | Lim, C.K., Chapman, J.N., Rahman, M., Johnston, A., and O'Donnell, D.O. |
| Subjects: | Q Science > QC Physics |
| College/School: | College of Science and Engineering > School of Physics and Astronomy |
| Journal Name: | Journal of Applied Physics |
| ISSN: | 0021-8979 |
| ISSN (Online): | 1089-7550 |
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