Exploiting smallest error to calibrate non-linearity in SAR ADCs

Fan, H., Li, J., Feng, Q., Sun, H. and Heidari, H. (2018) Exploiting smallest error to calibrate non-linearity in SAR ADCs. IEEE Access, 6, pp. 42930-42940. (doi:10.1109/ACCESS.2018.2852729)

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Abstract

This paper presents a statistics-optimised organisation technique to achieve better element matching in Successive Approximation Register (SAR) Analog-to-Digital Converter (ADC) in smart sensor systems. We demonstrate the proposed technique ability to achieve a significant improvement of around 23 dB on Spurious Free Dynamic Range (SFDR) of the ADC than the conventional, testing with a capacitor mismatch σu = 0.2% in a 14 bit SAR ADC system. For the static performance, the max root mean square (rms) value of differential nonlinearity (DNL) reduces from 1.63 to 0.20 LSB and the max rms value of integral nonlinearity (INL) reduces from 2.10 to 0.21 LSB. In addition, it is demonstrated that by applying grouping optimisation and strategy optimisation, the performance boosting on SFDR can be effectively achieved. Such great improvement on the resolution of the ADC only requires an off-line pre-processing digital part.

Item Type:Articles
Additional Information:The work of Hua Fan was supported by the National Natural Science Foundation of China (NSFC) under Grant 61771111, as well as supported by China Postdoctoral Science Foundation under grant 2017M612940 and Special Foundation of Sichuan Provincial Postdoctoral Science Foundation. The work of Quanyuan Feng was supported by the National Natural Science Foundation of China (NSFC) under Grant 61531016, supported by the project of Science and Technology Support Program of Sichuan Province under Grant 2015GZ0103, and in part by the Sichuan Provincial Science and Technology Important Projects under Grant 2017GZ0110.
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Heidari, Dr Hadi
Authors: Fan, H., Li, J., Feng, Q., Sun, H., and Heidari, H.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:IEEE Access
Publisher:IEEE
ISSN:2169-3536
ISSN (Online):2169-3536
Published Online:03 July 2018
Copyright Holders:Copyright © 2018 IEEE
First Published:First published in IEEE Access 6: 42930-42940
Publisher Policy:Reproduced in accordance with the copyright policy of the publisher

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