Background-oriented schlieren (BOS) for scramjet inlet-isolator investigation

Idris, A. C., Saad, M. R., Lo, K. H. and Kontis, K. (2018) Background-oriented schlieren (BOS) for scramjet inlet-isolator investigation. IOP Conference Series: Materials Science and Engineering, 370, 012003. (doi:10.1088/1757-899X/370/1/012003)

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Abstract

Background-oriented Schlieren (BOS) technique is a recently invented non-intrusive flow diagnostic method which has yet to be fully explored in its capabilities. In this paper, BOS technique has been applied for investigating the general flow field characteristics inside a generic scramjet inlet-isolator with Mach 5 flow. The difficulty in finding the delicate balance between measurement sensitivity and measurement area image focusing has been demonstrated. The differences between direct cross-correlation (DCC) and Fast Fourier Transform (FFT) raw data processing algorithm have also been demonstrated. As an exploratory study of BOS capability, this paper found that BOS is simple yet robust enough to be used to visualize complex flow in a scramjet inlet in hypersonic flow. However, in this case its quantitative data can be strongly affected by 3-dimensionality thus obscuring the density value with significant errors.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Kontis, Professor Konstantinos and Lo, Dr Kin Hing
Authors: Idris, A. C., Saad, M. R., Lo, K. H., and Kontis, K.
College/School:College of Science and Engineering > School of Engineering > Aerospace Sciences
Journal Name:IOP Conference Series: Materials Science and Engineering
Publisher:IOP Publishing
ISSN:1757-8981
ISSN (Online):1757-899X
Published Online:01 June 2018
Copyright Holders:Copyright © 2018 The Authors
First Published:First published in IOP Conference Series: Materials Science and Engineering 370:012003
Publisher Policy:Reproduced under a Creative Commons License

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