EBSD Across the Length Scales: New Possibilities With High Speed CMOS-based EBSD detectors

Trimby, P., Jiang, H., Porter, J. and Daly, L. (2018) EBSD Across the Length Scales: New Possibilities With High Speed CMOS-based EBSD detectors. EBSD 2018, Ann Arbour, MI, USA, 23-25 May 2018.

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Abstract

No abstract available.

Item Type:Conference or Workshop Item
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Daly, Dr Luke
Authors: Trimby, P., Jiang, H., Porter, J., and Daly, L.
College/School:College of Science and Engineering > School of Geographical and Earth Sciences
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