Grant, J. , Kenney, M. , Shah, Y. D. , Escorcia-Carranza, I. and Cumming, D. S. (2018) CMOS compatible metamaterial absorbers for hyperspectral medium wave infrared imaging and sensing applications. Optics Express, 26(8), pp. 10408-10420. (doi: 10.1364/OE.26.010408)
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Abstract
We experimentally demonstrate a CMOS compatible medium wave infrared metal-insulator-metal (MIM) metamaterial absorber structure where for a single dielectric spacer thickness at least 93% absorption is attained for 10 separate bands centred at 3.08, 3.30, 3.53, 3.78, 4.14, 4.40, 4.72, 4.94, 5.33, 5.60 μm. Previous hyperspectral MIM metamaterial absorber designs required that the thickness of the dielectric spacer layer be adjusted in order to attain selective unity absorption across the band of interest thereby increasing complexity and cost. We show that the absorption characteristics of the hyperspectral metamaterial structures are polarization insensitive and invariant for oblique incident angles up to 25° making them suitable for practical implementation in an imaging system. Finally, we also reveal that under TM illumination and at certain oblique incident angles there is an extremely narrowband Fano resonance (Q < 50) between the MIM absorber mode and the surface plasmon polariton mode that could have applications in hazardous/toxic gas identification and biosensing.
| Item Type: | Articles |
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| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Cumming, Professor David and Grant, Dr James and Shah, Dr Yash Diptesh and Kenney, Dr Mitchell Guy and Escorcia Carranza, Dr Ivonne |
| Authors: | Grant, J., Kenney, M., Shah, Y. D., Escorcia-Carranza, I., and Cumming, D. S. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Journal Name: | Optics Express |
| Publisher: | Optical Society of America |
| ISSN: | 1094-4087 |
| ISSN (Online): | 1094-4087 |
| Published Online: | 10 April 2018 |
| Copyright Holders: | Copyright © 2018 Optical Society of America |
| First Published: | First published in Optics Express 26(8):10408-10420 |
| Publisher Policy: | Reproduced under a Creative Commons License |
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