Topological Alignment of NLCS Using Nanoscale Metallic Grooves

Ghannam, R. , Collings, N., Crossland, W. and Wilkinson, T. (2006) Topological Alignment of NLCS Using Nanoscale Metallic Grooves. In: SPIE Optics and Photonics 2006, San Diego, CA, USA, 13-17 Aug 2006, 63320H. (doi:10.1117/12.680299)

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Abstract

Liquid crystal on silicon (LCoS) devices have been exploiting the ever-diminishing CMOS silicon process, which is pushing towards 45nm dimensions. Consequently, such fine metallic structures are bound to influence the alignment of the liquid crystal material. To illustrate this, a number of 1D metal patterns with differing mark-to-space ratio were fabricated using an Electron-Beam exposure technique. The results confirmed Dwight Berreman's topological alignment theory regarding the pitch of the surface topography and how this influences the quality of the planar alignment. Patterns with a metal to spacing ratio of 1:1 were shown to yield higher contrast ratios and hence better planar alignment. Such findings could be useful for developing non-intrusive alignment methods for nanoscale LCoS devices.

Item Type:Conference Proceedings
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Ghannam, Dr Rami
Authors: Ghannam, R., Collings, N., Crossland, W., and Wilkinson, T.
College/School:College of Science and Engineering > School of Engineering
ISSN:0277-786X

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