An Atom Probe Tomography and STEM-EDX Study of Interfaces in a Cu-doped TiNiSn Thermoelectric Material

Halpin, J., Bagot, P. A.J., Daly, L., Moody, M. P., Bos, J.-W. G. and MacLaren, D. (2018) An Atom Probe Tomography and STEM-EDX Study of Interfaces in a Cu-doped TiNiSn Thermoelectric Material. Interfaces in Energy Materials 2018, Cambridge, UK, 10-12 Apr 2018.

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Abstract

No abstract available.

Item Type:Conference or Workshop Item
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Daly, Dr Luke and Halpin, Dr John and MacLaren, Dr Donald
Authors: Halpin, J., Bagot, P. A.J., Daly, L., Moody, M. P., Bos, J.-W. G., and MacLaren, D.
College/School:College of Science and Engineering > School of Geographical and Earth Sciences
College of Science and Engineering > School of Physics and Astronomy
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