Preparation of high-quality planar FeRh thin films for in situ TEM investigations

Almeida, T. P. , McGrouther, D. , Pivak, Y., Perez Garza, H. H., Temple, R., Massey, J., Marrows, C. H. and McVitie, S. (2017) Preparation of high-quality planar FeRh thin films for in situ TEM investigations. Journal of Physics: Conference Series, 903(1), 012022. (doi:10.1088/1742-6596/903/1/012022)

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Abstract

The preparation of a planar FeRh thin film using a focused ion beam (FIB) secondary electron microscope (SEM) for the purpose of in situ transmission electron microscopy (TEM) is presented. A custom SEM stub with 45° faces allows for the transfer and milling of the sample on a TEM heating chip, whilst Fresnel imaging within the TEM revealed the presence of the magnetic domain walls, confirming the quality of the FIB-prepared sample.

Item Type:Articles
Additional Information:8th Joint European Magnetic Symposia (JEMS2016) 21–26 August 2016, Glasgow, UK
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:McGrouther, Dr Damien and McVitie, Professor Stephen and Almeida, Dr Trevor
Authors: Almeida, T. P., McGrouther, D., Pivak, Y., Perez Garza, H. H., Temple, R., Massey, J., Marrows, C. H., and McVitie, S.
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Journal of Physics: Conference Series
Publisher:Institute of Physics Publishing Ltd.
ISSN:1742-6588
ISSN (Online):1742-6596
Copyright Holders:Copyright © 2017 The Authors
First Published:First published in Journal of Physics: Conference Series 903(1):012022
Publisher Policy:Reproduced under a Creative Commons License

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Project CodeAward NoProject NamePrincipal InvestigatorFunder's NameFunder RefLead Dept
680211Current-driven domain wall motion and magnetomemristance in FeRh-based nanostructuresStephen McVitieEngineering and Physical Sciences Research Council (EPSRC)EP/M019020/1S&E P&A - PHYSICS & ASTRONOMY