Almeida, T. P. , McGrouther, D. , Pivak, Y., Perez Garza, H. H., Temple, R., Massey, J., Marrows, C. H. and McVitie, S. (2017) Preparation of high-quality planar FeRh thin films for in situ TEM investigations. Journal of Physics: Conference Series, 903(1), 012022. (doi: 10.1088/1742-6596/903/1/012022)
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Abstract
The preparation of a planar FeRh thin film using a focused ion beam (FIB) secondary electron microscope (SEM) for the purpose of in situ transmission electron microscopy (TEM) is presented. A custom SEM stub with 45° faces allows for the transfer and milling of the sample on a TEM heating chip, whilst Fresnel imaging within the TEM revealed the presence of the magnetic domain walls, confirming the quality of the FIB-prepared sample.
Item Type: | Articles |
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Additional Information: | 8th Joint European Magnetic Symposia (JEMS2016) 21–26 August 2016, Glasgow, UK |
Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | McVitie, Professor Stephen and McGrouther, Dr Damien and Almeida, Dr Trevor |
Authors: | Almeida, T. P., McGrouther, D., Pivak, Y., Perez Garza, H. H., Temple, R., Massey, J., Marrows, C. H., and McVitie, S. |
College/School: | College of Science and Engineering > School of Physics and Astronomy |
Journal Name: | Journal of Physics: Conference Series |
Publisher: | Institute of Physics Publishing Ltd. |
ISSN: | 1742-6588 |
ISSN (Online): | 1742-6596 |
Copyright Holders: | Copyright © 2017 The Authors |
First Published: | First published in Journal of Physics: Conference Series 903(1):012022 |
Publisher Policy: | Reproduced under a Creative Commons License |
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