Radiation hardness studies of AMS HV-CMOS 350 nm prototype chip HVStripV1

Kanisauskas, K. et al. (2017) Radiation hardness studies of AMS HV-CMOS 350 nm prototype chip HVStripV1. Journal of Instrumentation, 12(2), P02010. (doi: 10.1088/1748-0221/12/02/P02010)

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Abstract

CMOS active pixel sensors are being investigated for their potential use in the ATLAS inner tracker upgrade at the HL-LHC. The new inner tracker will have to handle a significant increase in luminosity while maintaining a sufficient signal-to-noise ratio and pulse shaping times. This paper focuses on the prototype chip “HVStripV1” (manufactured in the AMS HV-CMOS 350nm process) characterization before and after irradiation up to fluence levels expected for the strip region in the HL-LHC environment. The results indicate an increase of depletion region after irradiation for the same bias voltage by a factor of ≈ 2.4 and ≈ 2.8 for two active pixels on the test chip. There was also a notable increase in noise levels from 85 e− to 386 e− and from 75 e− to 277 e− for the corresponding pixels.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Maneuski, Dr Dima and Blue, Dr Andrew and Kanisauskas, Mr Kestutis and Bates, Dr Richard and Buttar, Professor Craig
Authors: Kanisauskas, K., Affolder, A., Arndt, K., Bates, R., Benoit, M., Di Bello, F., Blue, A., Bortoletto, D., Buckland, M., Buttar, C., Caragiulo, P., Das, D., Dopke, J., Dragone, A., Ehrler, F., Fadeyev, V., Galloway, Z., Grabas, H., Gregor, I.M., Grenier, P., Grillo, A., Hiti, B., Hoeferkamp, M., Hommels, L.B.A., Huffman, B.T., John, J., Kenney, C., Kramberger, J., Liang, Z., Mandic, I., Maneuski, D., Martinez-Mckinney, F., MacMahon, S., Meng, L., Mikuž, M., Muenstermann, D., Nickerson, R., Peric, I., Phillips, P., Plackett, R., Rubbo, F., Segal, J., Seidel, S., Seiden, A., Shipsey, I., Song, W., Staniztki, M., Su, D., Tamma, C., Turchetta, R., Vigani, L., Volk, J., Wang, R., Warren, M., Wilson, F., Worm, S., Xiu, Q., Zhang, J., and Zhu, H.
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Journal of Instrumentation
Publisher:IOP Publishing
ISSN:1748-0221
ISSN (Online):1748-0221
Published Online:15 February 2017
Copyright Holders:Copyright © 2017 CERN
First Published:First published in Journal of Instrumentation 12(2): P02010
Publisher Policy:Reproduced under a Creative Commons license

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