Atomistic scattering close to an interface

Barker, J.R. and Watling, J.R. (2006) Atomistic scattering close to an interface. Journal of Physics: Conference Series, 38(1), pp. 204-207. (doi:10.1088/1742-6596/38/1/049)

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Publisher's URL: http://dx.doi.org/10.1088/1742-6596/38/1/049

Abstract

Half-space Green functions and T-matrix theory is used to predict that scattering on discrete dopants close to a perfect interface generates strong deviations from scattering in the bulk. Interference between the scattered wave and its reflection from the interface leads to a dipolar scattering rate. By introducing de-coherence the transition to bulk scattering is described quantitatively for strongly screened Coulomb scattering.

Item Type:Articles
Keywords:Atomistic, device, devices, interface, interfaces, scattering, surface, surfaces
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Barker, Professor John and Watling, Dr Jeremy
Authors: Barker, J.R., and Watling, J.R.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Journal of Physics: Conference Series
Publisher:Institute of Physics Publishing Ltd.
ISSN:1742-6588
ISSN (Online):1742-6596

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Project CodeAward NoProject NamePrincipal InvestigatorFunder's NameFunder RefLead Dept
370511The impact of Interface Roughness & Self-Heating on the performance of Nano-Scale MOSFETsJeremy WatlingEngineering & Physical Sciences Research Council (EPSRC)GR/S97194/01Electronic and Nanoscale Engineering