Non-equilibrium hole transport in deep sub-micron well-tempered Si p-MOSFETs

Watling, J.R., Zhao, Y.P., Asenov, A. and Barker, J.R. (2001) Non-equilibrium hole transport in deep sub-micron well-tempered Si p-MOSFETs. VLSI Design, 13, pp. 169-173.

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Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Barker, Professor John and Watling, Dr Jeremy and Asenov, Professor Asen
Authors: Watling, J.R., Zhao, Y.P., Asenov, A., and Barker, J.R.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:VLSI Design

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