Effective mobilities in pseudomorphic Si/SiGe/Si p-channel metal-oxide-semiconductor field-effect transistors with thin silicon capping layers

Palmer, M. et al. (2001) Effective mobilities in pseudomorphic Si/SiGe/Si p-channel metal-oxide-semiconductor field-effect transistors with thin silicon capping layers. Applied Physics Letters, 78, pp. 1424-1426.

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Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Asenov, Professor Asen and Watling, Dr Jeremy and Roy, Professor Scott
Authors: Palmer, M., Braithwaite, G., Grasby, T., Phillips, P., Prest, M., Parker, E., Whall, T., Parry, C., Waite, A., Evans, A., Roy, S., Watling, J., Kaya, S., and Asenov, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Applied Physics Letters

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