Accurate non-uniform transmission line model and its application to the de-embedding of on-wafer measurements

Young, P.R., McPherson, D.S., Chrisostomidis, C., Elgaid, K., Thayne, I.G. , Lucyszyn, S. and Robertson, I.D. (2001) Accurate non-uniform transmission line model and its application to the de-embedding of on-wafer measurements. IEE Proceedings: Microwaves Antennas and Propagation, 148(3), pp. 153-156. (doi:10.1049/ip-map:20010402)

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Publisher's URL: http://dx.doi.org/10.1049/ip-map:20010402


Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Thayne, Professor Iain and Elgaid, Dr Khaled
Authors: Young, P.R., McPherson, D.S., Chrisostomidis, C., Elgaid, K., Thayne, I.G., Lucyszyn, S., and Robertson, I.D.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:IEE Proceedings: Microwaves Antennas and Propagation
ISSN:1350-2417

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