A study of the interface roughness effect in Si nanowires using a full 3D NEGF approach

Martinez, A., Kalna, K., Barker, J. and Asenov, A. (2007) A study of the interface roughness effect in Si nanowires using a full 3D NEGF approach. Physica E: Low-Dimensional Systems and Nanostructures, 37, pp. 168-172. (doi: 10.1016/j.physe.2006.07.007)

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Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Barker, Professor John and Asenov, Professor Asen and Kalna, Dr Karol
Authors: Martinez, A., Kalna, K., Barker, J., and Asenov, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Physica E: Low-Dimensional Systems and Nanostructures
Publisher:Elsevier BV
ISSN:1386-9477
ISSN (Online):1873-1759

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