Characterization of batch-microfabricated scanning electrochemical-atomic force microscopy probes

Dobson, P., Weaver, J., Holder, M., Unwin, P. and Macpherson, J. (2005) Characterization of batch-microfabricated scanning electrochemical-atomic force microscopy probes. Analytical Chemistry, 77, pp. 424-434. (doi:10.1021/ac048930e)

Full text not currently available from Enlighten.


Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Weaver, Professor Jonathan and Dobson, Dr Phil
Authors: Dobson, P., Weaver, J., Holder, M., Unwin, P., and Macpherson, J.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Analytical Chemistry

University Staff: Request a correction | Enlighten Editors: Update this record