Electron beam lithographically-defined scanning electrochemical-atomic force microscopy probes: fabrication method and application to high resolution imaging on heterogeneously active surfaces

Dobson, P., Weaver, J., Burt, D., Holder, M., Wilson, N., Unwin, P. and Macpherson, J. (2006) Electron beam lithographically-defined scanning electrochemical-atomic force microscopy probes: fabrication method and application to high resolution imaging on heterogeneously active surfaces. Physical Chemistry Chemical Physics, 8, pp. 3909-3914. (doi:10.1039/b605828k)

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Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Weaver, Professor Jonathan and Dobson, Dr Phil
Authors: Dobson, P., Weaver, J., Burt, D., Holder, M., Wilson, N., Unwin, P., and Macpherson, J.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Physical Chemistry Chemical Physics

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