Scanning Hall probe microscopy on an atomic force microscope tip

Chong, B.K., Zhou, H., Mills, G., Donaldson, L. and Weaver, J.M.R. (2001) Scanning Hall probe microscopy on an atomic force microscope tip. Journal of Vacuum Science and Technology A: Vacuum, Surfaces, and Films, 19(4), pp. 1769-1772.

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Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Zhou, Dr Haiping and Weaver, Professor Jonathan
Authors: Chong, B.K., Zhou, H., Mills, G., Donaldson, L., and Weaver, J.M.R.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Journal of Vacuum Science and Technology A: Vacuum, Surfaces, and Films
ISSN:0734-2101
ISSN (Online):1520-8559

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