Composition profiling at the atomic scale in III-V nanostructures by cross-sectional STM

Koenraad, P., Bruls, D., Davies, J. , Gill, S., Long, F., Hopkinson, M., Skolnick, M. and Wolter, J. (2003) Composition profiling at the atomic scale in III-V nanostructures by cross-sectional STM. Physica E: Low-Dimensional Systems and Nanostructures, 17, pp. 526-532. (doi:10.1016/S1386-9477(02)00860-3)

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Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Davies, Professor John
Authors: Koenraad, P., Bruls, D., Davies, J., Gill, S., Long, F., Hopkinson, M., Skolnick, M., and Wolter, J.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Physica E: Low-Dimensional Systems and Nanostructures
Publisher:Elsevier BV
ISSN:1386-9477
ISSN (Online):1873-1759

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