Koenraad, P., Bruls, D., Davies, J. , Gill, S., Long, F., Hopkinson, M., Skolnick, M. and Wolter, J. (2003) Composition profiling at the atomic scale in III-V nanostructures by cross-sectional STM. Physica E: Low-Dimensional Systems and Nanostructures, 17, pp. 526-532. (doi: 10.1016/S1386-9477(02)00860-3)
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Item Type: | Articles |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Davies, Professor John |
Authors: | Koenraad, P., Bruls, D., Davies, J., Gill, S., Long, F., Hopkinson, M., Skolnick, M., and Wolter, J. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
Journal Name: | Physica E: Low-Dimensional Systems and Nanostructures |
Publisher: | Elsevier BV |
ISSN: | 1386-9477 |
ISSN (Online): | 1873-1759 |
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