Characterisation of the Medipix3 detector for 60 and 80 keV electrons

Mir, J.A. et al. (2017) Characterisation of the Medipix3 detector for 60 and 80 keV electrons. Ultramicroscopy, 182, pp. 44-53. (doi:10.1016/j.ultramic.2017.06.010)

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Abstract

In this paper we report quantitative measurements of the imaging performance for the current generation of hybrid pixel detector, Medipix3, used as a direct electron detector. We have measured the modulation transfer function and detective quantum efficiency at beam energies of 60 and 80 keV. In single pixel mode, energy threshold values can be chosen to maximize either the modulation transfer function or the detective quantum efficiency, obtaining values near to, or exceeding those for a theoretical detector with square pixels. The Medipix3 charge summing mode delivers simultaneous, high values of both modulation transfer function and detective quantum efficiency. We have also characterized the detector response to single electron events and describe an empirical model that predicts the detector modulation transfer function and detective quantum efficiency based on energy threshold. Exemplifying our findings we demonstrate the Medipix3 imaging performance recording a fully exposed electron diffraction pattern at 24-bit depth together with images in single pixel and charge summing modes. Our findings highlight that for transmission electron microscopy performed at low energies (energies <100 keV) thick hybrid pixel detectors provide an advantageous architecture for direct electron imaging.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:McGrouther, Dr Damien and Gough, Christopher and O'Shea, Professor Valentine and Maneuski, Dr Dzmitry and MacLaren, Dr Ian
Authors: Mir, J.A., Clough, R., MacInnes, R., Gough, C., Plackett, R., Shipsey, I., Sawada, H., MacLaren, I., Ballabriga, R., Maneuski, D., O'Shea, V., McGrouther, D., and Kirkland, A.I.
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Ultramicroscopy
Publisher:Elsevier
ISSN:0304-3991
ISSN (Online):1879-2723
Published Online:20 June 2017
Copyright Holders:Copyright © 2017 Elsevier B.V.
First Published:First published in Ultramicroscopy 182: 44-53
Publisher Policy:Reproduced under a Creative Commons license

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Project CodeAward NoProject NamePrincipal InvestigatorFunder's NameFunder RefLead Dept
655181Fast Pixel Detectors: a paradigm shift in STEM imagingIan MaclarenEngineering and Physical Sciences Research Council (EPSRC)EP/M009963/1S&E P&A - PHYSICS & ASTRONOMY