TCAD-based design technology co-optimization for variability in nanoscale SOI FinFETs

Wang, X., Georgiev, V. P. , Adamu-Lema, F., Gerrer, L., Amoroso, S. M. and Asenov, A. (2017) TCAD-based design technology co-optimization for variability in nanoscale SOI FinFETs. In: Deleonibus, S. (ed.) Integrated Nanodevice and Nanosystem Fabrication. Series: Pan Stanford series on intelligent nanosystems. Pan Stanford: Singapore, pp. 215-252. ISBN 9789814774222

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Publisher's URL: http://www.panstanford.com/books/9789814774222.html


Item Type:Book Sections
Status:Published
Glasgow Author(s) Enlighten ID:Gerrer, Dr Louis and Wang, Dr Xingsheng and Amoroso, Dr Salvatore and Asenov, Professor Asen and Adamu-Lema, Dr Fikru and Georgiev, Dr Vihar
Authors: Wang, X., Georgiev, V. P., Adamu-Lema, F., Gerrer, L., Amoroso, S. M., and Asenov, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Publisher:Pan Stanford
ISBN:9789814774222

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