Linewidth, autocorrelation, and cross-correlation measurements of counterpropagating modes in GaAs-AlGaAs semiconductor ring lasers

Giuliani, G., Miglierina, R., Sorel, M. and Scire, A. (2005) Linewidth, autocorrelation, and cross-correlation measurements of counterpropagating modes in GaAs-AlGaAs semiconductor ring lasers. IEEE Journal of Selected Topics in Quantum Electronics, 11(5), pp. 1187-1192. (doi:10.1109/JSTQE.2005.854144)

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Publisher's URL: http://dx.doi.org/10.1109/JSTQE.2005.854144

Abstract

We perform an experimental investigation of the linear autocorrelation and cross correlation properties of the two counterpropagating modes of a monolithic semiconductor ring laser (SRL). The ring laser can operate in a bidirectional regime where the two modes are active at the same time and have equal power, and also in a unidirectional regime where one of the modes is suppressed. Autocorrelation measurements are carried out using an unbalanced optical fiber Mach-Zehnder interferometer that allows us to determine the linewidth of each mode of the ring laser. Cross correlation measurements are performed using a modified optical fiber interferometric setup where the two counterpropagating modes are directly superposed on a photodetector. This measurement reveals that in the bidirectional regime the two modes are phase-locked and allows us to evaluate the degree of their correlation.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Sorel, Professor Marc
Authors: Giuliani, G., Miglierina, R., Sorel, M., and Scire, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:IEEE Journal of Selected Topics in Quantum Electronics
Publisher:Institute of Electrical and Electronics Engineers
ISSN:1077-260X
ISSN (Online):1558-4542

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Project CodeAward NoProject NamePrincipal InvestigatorFunder's NameFunder RefLead Dept
358931RAPTOR - rapidly tuneable semiconductor ring laserMarc SorelEngineering & Physical Sciences Research Council (EPSRC)GR/S63533/01Electronic and Nanoscale Engineering