Impact of single charge trapping in nano-MOSFETs - Electrostatics versus transport effects

Alexander, C., Brown, A., Watling, J. and Asenov, A. (2005) Impact of single charge trapping in nano-MOSFETs - Electrostatics versus transport effects. IEEE Transactions on Nanotechnology, 4, pp. 339-344. (doi:10.1109/TNANO.2005.846929)

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Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Watling, Dr Jeremy and Asenov, Professor Asen
Authors: Alexander, C., Brown, A., Watling, J., and Asenov, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:IEEE Transactions on Nanotechnology

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