Uncertainties of multiport VNA S-parameter measurements applying the GSOLT calibration method

Zhao, W., Yang, X., Xiao, J., Abbasi, Q. H. , Qin, H. and Ren, H. (2012) Uncertainties of multiport VNA S-parameter measurements applying the GSOLT calibration method. IEEE Transactions on Instrumentation and Measurement, 61(12), pp. 3251-3258. (doi: 10.1109/TIM.2012.2210332)

Full text not currently available from Enlighten.

Abstract

For the general short-open-load-thru (SOLT) calibration of the n-port vector network analyzer with n + 1 measurement channels, the sensitivity coefficients for the S-parameters of the n-port device under test are developed as functions of the deviations of the scattering parameters for the SOLT calibration standards. Using the concept of general node equation, a generalized formula for the S-parameter deviations with respect to the error terms has been deduced. In addition, expressions representing the deviations of error terms with respect to the non-ideal calibration standards are given by a series of matrix operations. Finally, after calculation of sensitivity coefficients, they can be used for establishing the type-B uncertainty budget for S-parameter measurements.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Abbasi, Professor Qammer
Authors: Zhao, W., Yang, X., Xiao, J., Abbasi, Q. H., Qin, H., and Ren, H.
College/School:College of Science and Engineering > School of Engineering
Journal Name:IEEE Transactions on Instrumentation and Measurement
Publisher:IEEE
ISSN:0018-9456
ISSN (Online):1557-9662
Published Online:22 August 2012

University Staff: Request a correction | Enlighten Editors: Update this record