Monolithic Integration of a Plasmonic Sensor with CMOS Technology

Shakoor, A. , Cheah, B. C. , Hao, D., Al-Rawhani, M., Nagy, B., Grant, J. , Dale, C., Keegan, N., McNeil, C. and Cumming, D. R.S. (2017) Monolithic Integration of a Plasmonic Sensor with CMOS Technology. In: Smart Photonic and Optoelectronic Integrated Circuits XIX, San Francisco, CA, USA, 31 Jan - 2 Feb 2017, p. 101070. (doi:10.1117/12.2250504)

Shakoor, A. , Cheah, B. C. , Hao, D., Al-Rawhani, M., Nagy, B., Grant, J. , Dale, C., Keegan, N., McNeil, C. and Cumming, D. R.S. (2017) Monolithic Integration of a Plasmonic Sensor with CMOS Technology. In: Smart Photonic and Optoelectronic Integrated Circuits XIX, San Francisco, CA, USA, 31 Jan - 2 Feb 2017, p. 101070. (doi:10.1117/12.2250504)

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Abstract

Monolithic integration of nanophotonic sensors with CMOS detectors can transform the laboratory based nanophotonic sensors into practical devices with a range of applications in everyday life. In this work, by monolithically integrating an array of gold nanodiscs with the CMOS photodiode we have developed a compact and miniaturized nanophotonic sensor system having direct electrical read out. Doing so eliminates the need of expensive and bulky laboratory based optical spectrum analyzers used currently for measurements of nanophotonic sensor chips. The experimental optical sensitivity of the gold nanodiscs is measured to be 275 nm/RIU which translates to an electrical sensitivity of 5.4 V/RIU. This integration of nanophotonic sensors with the CMOS electronics has the potential to revolutionize personalized medical diagnostics similar to the way in which the CMOS technology has revolutionized the electronics industry.

Item Type:Conference Proceedings
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Al-Rawhani, Dr Mohammed and Shakoor, Dr Abdul and Grant, Dr James and Cumming, Professor David and Nagy, Mr Bence and Cheah, Dr Boon Chong and Hao, Miss Danni
Authors: Shakoor, A., Cheah, B. C., Hao, D., Al-Rawhani, M., Nagy, B., Grant, J., Dale, C., Keegan, N., McNeil, C., and Cumming, D. R.S.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
ISSN:0277-786X
Copyright Holders:Copyright © 2017 SPIE
Publisher Policy:Reproduced in accordance with the copyright policy of the publisher

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Project CodeAward NoProject NamePrincipal InvestigatorFunder's NameFunder RefLead Dept
605821The Multi-Corder: Poly-Sensor TechnologyDavid CummingEngineering & Physical Sciences Research Council (EPSRC)EP/K021966/1ENG - ENGINEERING ELECTRONICS & NANO ENG