Begbie, M.L., Sibbett, W. and Padgett, M.J. (2001) Mueller matrix error correction for a fringe-free interferometry system. Applied Optics, 40(19), pp. 3205-3210. (doi: 10.1364/AO.40.003205)
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Publisher's URL: http://www.opticsinfobase.org/abstract.cfm?URI=ao-40-19-3205
Abstract
We present an automated surface profiling system based on a shearing interferometer, in which precise measurement of the polarization states eliminates fringe ambiguity. A full error correction based on Mueller matrices allows comparatively inaccurate but rapidly switchable liquid-crystal wave plates to be used, enabling unambiguous profile information to be obtained in real time.
| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Padgett, Professor Miles |
| Authors: | Begbie, M.L., Sibbett, W., and Padgett, M.J. |
| Subjects: | Q Science > QC Physics |
| College/School: | College of Science and Engineering > School of Physics and Astronomy |
| Journal Name: | Applied Optics |
| ISSN: | 0003-6935 |
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