Mueller matrix error correction for a fringe-free interferometry system

Begbie, M.L., Sibbett, W. and Padgett, M.J. (2001) Mueller matrix error correction for a fringe-free interferometry system. Applied Optics, 40(19), pp. 3205-3210. (doi: 10.1364/AO.40.003205)

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We present an automated surface profiling system based on a shearing interferometer, in which precise measurement of the polarization states eliminates fringe ambiguity. A full error correction based on Mueller matrices allows comparatively inaccurate but rapidly switchable liquid-crystal wave plates to be used, enabling unambiguous profile information to be obtained in real time.

Item Type:Articles
Glasgow Author(s) Enlighten ID:Padgett, Professor Miles
Authors: Begbie, M.L., Sibbett, W., and Padgett, M.J.
Subjects:Q Science > QC Physics
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Applied Optics

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