BESOI Using a Silicon Germanium Etch Stop

Li, X. , Gay, D.L., McNeill, D.W., Armstrong, B.M. and Gamble, H.S. (1998) BESOI Using a Silicon Germanium Etch Stop. In: Fourth International Symposium on Semiconductor Wafer Bonding : Science, Technology, and Applications, Paris, France, 1997, pp. 313-320. ISBN 9781566771894

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Abstract

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Item Type:Conference Proceedings
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Li, Dr Xu
Authors: Li, X., Gay, D.L., McNeill, D.W., Armstrong, B.M., and Gamble, H.S.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
ISBN:9781566771894

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