Investigating the relationship between material properties and laser-induced damage threshold of dielectric optical coatings at 1064 nm

Bassiri, R., Clark, C., Martin, I. W. , Markosyan, A., Murray, P. G., Tessmer, J., Rowan, S. and Fejer, M. M. (2015) Investigating the relationship between material properties and laser-induced damage threshold of dielectric optical coatings at 1064 nm. Proceedings of the SPIE: The International Society for Optical Engineering, 9632, 963204. (doi:10.1117/12.2194784)

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Abstract

The Laser Induced Damage Threshold (LIDT) and material properties of various multi-layer amorphous dielectric optical coatings, including Nb2O5, Ta2O5, SiO2, TiO2, ZrO2, AlN, SiN, LiF and ZnSe, have been studied. The coatings were produced by ion assisted electron beam and thermal evaporation; and RF and DC magnetron sputtering at Helia Photonics Ltd, Livingston, UK. The coatings were characterized by optical absorption measurements at 1064 nm by Photothermal Common-path Interferometry (PCI). Surface roughness and damage pits were analyzed using atomic force microscopy. LIDT measurements were carried out at 1064 nm, with a pulse duration of 9.6 ns and repetition rate of 100 Hz, in both 1000-on-1 and 1-on-1 regimes. The relationship between optical absorption, LIDT and post-deposition heattreatment is discussed, along with analysis of the surface morphology of the LIDT damage sites showing both coating and substrate failure.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Rowan, Professor Sheila and Martin, Dr Iain and Bassiri, Mr Riccardo and Murray, Dr Peter
Authors: Bassiri, R., Clark, C., Martin, I. W., Markosyan, A., Murray, P. G., Tessmer, J., Rowan, S., and Fejer, M. M.
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Proceedings of the SPIE: The International Society for Optical Engineering
Publisher:Society of Photo-optical Instrumentation Engineers
ISSN:0277-786X
ISSN (Online):1996-756X
Copyright Holders:Copyright © 2016 Society of Photo-Optical Instrumentation Engineers (SPIE)
First Published:First published in Proceedings of the SPIE: The International Society for Optical Engineering 9632: 963204
Publisher Policy:Reproduced in accordance with the publisher copyright policy

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