Assessing electron beam sensitivity for SrTiO3 and La0.7Sr0.3MnO3 using electron energy loss spectroscopy

Nord, M., Vullum, P. E., Hallsteinsen, I., Tybell, T. and Holmestad, R. (2016) Assessing electron beam sensitivity for SrTiO3 and La0.7Sr0.3MnO3 using electron energy loss spectroscopy. Ultramicroscopy, 169, pp. 98-106. (doi: 10.1016/j.ultramic.2016.07.004) (PMID:27454005)

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Abstract

Thresholds for beam damage have been assessed for La0.7Sr0.3MnO3 and SrTiO3 as a function of electron probe current and exposure time at 80 and 200 kV acceleration voltage. The materials were exposed to an intense electron probe by aberration corrected scanning transmission electron microscopy (STEM) with simultaneous acquisition of electron energy loss spectroscopy (EELS) data. Electron beam damage was identified by changes of the core loss fine structure after quantification by a refined and improved model based approach. At 200 kV acceleration voltage, damage in SrTiO3 was identified by changes both in the EEL fine structure and by contrast changes in the STEM images. However, the changes in the STEM image contrast as introduced by minor damage can be difficult to detect under several common experimental conditions. No damage was observed in SrTiO3 at 80 kV acceleration voltage, independent of probe current and exposure time. In La0.7Sr0.3MnO3, beam damage was observed at both 80 and 200 kV acceleration voltages. This damage was observed by large changes in the EEL fine structure, but not by any detectable changes in the STEM images. The typical method to validate if damage has been introduced during acquisitions is to compare STEM images prior to and after spectroscopy. Quantifications in this work show that this method possibly can result in misinterpretation of beam damage as changes of material properties.

Item Type:Articles
Additional Information:The Research Council of Norway (RCN) is acknowledged for the support to the Norwegian Micro- and Nano-Fabrication Facility, NorFab (197413/V30). Partial funding for this work was obtained from the Norwegian PhD Network on Nanotechnology for Microsystems, which is sponsored by the RCN, Division for Science, under contract no. 190086/S10. Funding for TEM time is partly funded by the project NORTEM (Grant 197405) within the programme INFRASTRUCTURE of the RCN. NORTEM was co-funded by the RCN and the project partners NTNU, UiO and SINTEF
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Nord, Dr Magnus
Authors: Nord, M., Vullum, P. E., Hallsteinsen, I., Tybell, T., and Holmestad, R.
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Ultramicroscopy
Publisher:Elsevier
ISSN:0304-3991
Published Online:05 July 2016
Copyright Holders:Copyright © 2016 Elsevier B.V.
First Published:First published in Ultramicroscopy 169: 98-106
Publisher Policy:Reproduced in accordance with the publisher copyright policy

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