Role of rf power on the properties of undoped SnOx films deposited by rf-PERTE at low substrate temperature

Valente, J. , Lavareda, G., Conde, O., Parreira, P. , Amaral, A. and Nunes de Carvalho, C. (2008) Role of rf power on the properties of undoped SnOx films deposited by rf-PERTE at low substrate temperature. Surface and Coatings Technology, 202(16), pp. 3893-3896. (doi:10.1016/j.surfcoat.2008.01.033)

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Abstract

Transparent and conductive undoped tin oxide (SnOx) thin films were deposited at low substrate temperature (< 140 °C) by radio frequency (rf) plasma enhanced reactive thermal evaporation (rf-PERTE) of tin (Sn) in the presence of oxygen The undoped SnOx films were not submitted to any post-annealing treatments. The influence of rf power variation on the optical, electrical and structural properties of the as-grown films is presented. A variation in the films' structure was verified with the increase of rf power. Undoped SnOx films, 90 nm average thick, deposited at rf power range of 60–70 W are nanocrystalline, show a conductive behaviour, an average visible transmittance of ≥ 80% and a maximum electrical conductivity of about 34.6 (Ω cm)− 1. Films deposited at lower values of rf power (40 W) are amorphous and exhibit a semiconductive behaviour, showing an electrical conductivity of about 7.54 × 10− 1 (Ω cm)− 1. As a low substrate temperature deposition process is used, SnOx thin films can be obtained on a wide range of substrates.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Valente, Dr Joao and Parreira, Dr Pedro Miguel
Authors: Valente, J., Lavareda, G., Conde, O., Parreira, P., Amaral, A., and Nunes de Carvalho, C.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Surface and Coatings Technology
Publisher:Elsevier
ISSN:0257-8972
ISSN (Online):1879-3347
Published Online:08 February 2008

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