High-throughput powder diffraction. I. A new approach to qualitative and quantitative powder diffraction pattern analysis using full pattern profiles

Gilmore, C., Barr, G. and Paisley, J. (2004) High-throughput powder diffraction. I. A new approach to qualitative and quantitative powder diffraction pattern analysis using full pattern profiles. Journal of Applied Crystallography, 37, pp. 231-242. (doi: 10.1107/S002188980400038X)

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Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Gilmore, Professor Chris
Authors: Gilmore, C., Barr, G., and Paisley, J.
College/School:College of Science and Engineering > School of Chemistry
Journal Name:Journal of Applied Crystallography

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