Gilmore, C., Barr, G. and Paisley, J. (2004) High-throughput powder diffraction. I. A new approach to qualitative and quantitative powder diffraction pattern analysis using full pattern profiles. Journal of Applied Crystallography, 37, pp. 231-242. (doi: 10.1107/S002188980400038X)
Full text not currently available from Enlighten.
Item Type: | Articles |
---|---|
Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Gilmore, Professor Chris |
Authors: | Gilmore, C., Barr, G., and Paisley, J. |
College/School: | College of Science and Engineering > School of Chemistry |
Journal Name: | Journal of Applied Crystallography |
University Staff: Request a correction | Enlighten Editors: Update this record