Microscopic investigations of advanced thin films for photonics

Boninelli, S. et al. (2013) Microscopic investigations of advanced thin films for photonics. Journal of Physics: Conference Series, 471, 012004. (doi: 10.1088/1742-6596/471/1/012004)

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Abstract

We present the different approaches we recently followed to achieve intense room temperature photoluminescence (PL) from Si-based materials. On one side we obtained sub-bandgap PL from H-related defects induced by the H2 plasma treatment of Si photonic crystal (PhC) nanocavities. We demonstrated that a strong and narrow PL emission can be obtained in the PhC nanocavities due to the formation of a damaged layer mainly consisting of nanometric platelets and bubbles. An overall 40000-fold enhancement of the PL signal, with respect to pure crystalline Si, has been achieved and moreover the signal can be tuned in a wide range by only changing the PhC parameters. On the other side, we focused our attention on the properties of SiO2 and SiOC host matrices doped with Eu ions. C addition produces a strong enhancement of the Eu PL with respect to pure SiO2 films. The chemical and structural characterization of these materials reveals an extensive Eu clustering in SiO2-based films, while C addition induces a significant reduction of this phenomenon, enhancing the fraction of optically active Eu ions. These results can be applied for the realization of efficient Si-based light sources.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Shakoor, Dr Abdul
Authors: Boninelli, S., Shakoor, A., Welma, K., Krauss, T.F., O'Faolain, L., Lo Savio, R., Portalupi, S., Gerace, D., Galli, M., Cardile, P., Bellocchi, G., Franzò, G., Miritello, M., Iacona, F., and Priolo, F.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Journal of Physics: Conference Series
Publisher:Institute of Physics Publishing Ltd.
ISSN:1742-6588
ISSN (Online):1742-6596
Copyright Holders:Copyright © 2013 IOP
First Published:First published in Journal of Physics: Conference Series 471:012004
Publisher Policy:Reproduced under a Creative Commons License

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