Ge, Y., Zhang, Y., Booth, J. A., Weaver, J. M.R. and Dobson, P. S. (2016) Quantification of probe-sample interactions of a scanning thermal microscope using a nanofabricated calibration sample having programmable size. Nanotechnology, 27(32), 325503. (doi: 10.1088/0957-4484/27/32/325503) (PMID:27363896)
|
Text
120317.pdf - Accepted Version 5MB |
Abstract
We report a method for quantifying scanning thermal microscopy (SThM) probe-sample thermal interactions in-air using a novel temperature calibration device. This new device has been designed, fabricated and characterized using SThM to provide an accurate and spatially variable temperature distribution that can be used as a temperature reference due to its unique design. The device was characterized by means of a microfabricated SThM probe operating in passive mode. This data was interpreted using a heat transfer model, built to describe the thermal interactions during a SThM thermal scan. This permitted the thermal contact resistance between the SThM tip and the device to be determined as 8.33 × 105 K/W. It also permitted the probe-sample contact radius to be clarified as being the same size as the probe’s tip radius of curvature. Finally, the data was used in the construction of a lumped-system steady state model for the SThM probe and its potential applications were addressed.
Item Type: | Articles |
---|---|
Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Weaver, Professor Jonathan and Dobson, Dr Phil and Zhang, Dr Yuan |
Authors: | Ge, Y., Zhang, Y., Booth, J. A., Weaver, J. M.R., and Dobson, P. S. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
Journal Name: | Nanotechnology |
Publisher: | IOP Publishing |
ISSN: | 0957-4484 |
ISSN (Online): | 1361-6528 |
Published Online: | 01 July 2016 |
Copyright Holders: | Copyright © 2016 IOP Publishing Ltd |
First Published: | First published in Nanotechnology 27(32):325503 |
Publisher Policy: | Reproduced in accordance with the copyright policy of the publisher |
University Staff: Request a correction | Enlighten Editors: Update this record