Quantification of probe-sample interactions of a scanning thermal microscope using a nanofabricated calibration sample having programmable size

Ge, Y. , Zhang, Y., Booth, J., Weaver, J. and Dobson, P. (2016) Quantification of probe-sample interactions of a scanning thermal microscope using a nanofabricated calibration sample having programmable size. Nanotechnology, 27(32), 325503. (doi:10.1088/0957-4484/27/32/325503) (PMID:27363896)

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Abstract

We report a method for quantifying scanning thermal microscopy (SThM) probe-sample thermal interactions in-air using a novel temperature calibration device. This new device has been designed, fabricated and characterized using SThM to provide an accurate and spatially variable temperature distribution that can be used as a temperature reference due to its unique design. The device was characterized by means of a microfabricated SThM probe operating in passive mode. This data was interpreted using a heat transfer model, built to describe the thermal interactions during a SThM thermal scan. This permitted the thermal contact resistance between the SThM tip and the device to be determined as 8.33 × 105 K/W. It also permitted the probe-sample contact radius to be clarified as being the same size as the probe’s tip radius of curvature. Finally, the data was used in the construction of a lumped-system steady state model for the SThM probe and its potential applications were addressed.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Weaver, Professor Jonathan and Zhang, Dr Yuan
Authors: Ge, Y., Zhang, Y., Booth, J., Weaver, J., and Dobson, P.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Nanotechnology
Publisher:IOP Publishing
ISSN:0957-4484
ISSN (Online):1361-6528
Published Online:01 July 2016
Copyright Holders:Copyright © 2016 IOP Publishing Ltd
First Published:First published in Nanotechnology 27(32):325503
Publisher Policy:Reproduced in accordance with the copyright policy of the publisher

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Project CodeAward NoProject NamePrincipal InvestigatorFunder's NameFunder RefLead Dept
622881QUANTIHEATPhil DobsonEuropean Commission (EC)604668ENG - ENGINEERING ELECTRONICS & NANO ENG