Absolute field strength determination of magnetic force microscope tip stray fields

McVitie, S. , Ferrier, R.P. and Nicholson, W.A.P. (1997) Absolute field strength determination of magnetic force microscope tip stray fields. In: Electron microscopy and analysis 1997 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, Cavendish Laboratory, University of Cambridge, 2-5 September 1997. Series: Institute of Physics conference series (153). Institute of Physics Pub.: Bristol ; Philadelphia, pp. 201-204. ISBN 9780750304412

McVitie, S. , Ferrier, R.P. and Nicholson, W.A.P. (1997) Absolute field strength determination of magnetic force microscope tip stray fields. In: Electron microscopy and analysis 1997 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, Cavendish Laboratory, University of Cambridge, 2-5 September 1997. Series: Institute of Physics conference series (153). Institute of Physics Pub.: Bristol ; Philadelphia, pp. 201-204. ISBN 9780750304412

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Abstract

Quantitative analysis of magnetic force microscope (MFM) images is only possible if the magnetic state of the sensing tip is known. In this paper we describe a method which is used to characterise the stray field produced by an MFM tip. The method utilises Lorentz microscopy techniques and tomographic field reconstruction algorithms. A specially constructed calibration specimen enables measurement of the absolute values of the tip stray field to be made.

Item Type:Book Sections
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:McVitie, Professor Stephen
Authors: McVitie, S., Ferrier, R.P., and Nicholson, W.A.P.
College/School:College of Science and Engineering > School of Physics and Astronomy
Publisher:Institute of Physics Pub.
ISSN:0951-3248
ISBN:9780750304412

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