Multiple dark-field STEM: A new method for beam-sensitive polymers

White, J.R., Chapman, J.N. and McVitie, S. (1991) Multiple dark-field STEM: A new method for beam-sensitive polymers. Journal of Polymer Science Part B: Polymer Physics, 29(1), pp. 31-38. (doi:10.1002/polb.1991.090290105)

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Abstract

A new method for recording multiple dark-field transmission electron micrographs using a scanning transmission electron microscope fitted with a quadrant detector is described. Simultaneous multiple recording is particularly advantageous when studying electron beamsensitive polymers and images of crystals of poly(butylene terephthalate) are presented by way of example. Resolution levels of ca. 10 nm are demonstrated.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:McVitie, Professor Stephen and Chapman, Professor John
Authors: White, J.R., Chapman, J.N., and McVitie, S.
College/School:College of Science and Engineering
College of Science and Engineering > School of Physics and Astronomy
Journal Name:Journal of Polymer Science Part B: Polymer Physics
Publisher:John Wiley & Sons Inc.
ISSN:0887-6266
ISSN (Online):1099-0488

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