Mapping induction distributions by transmission electron microscopy (invited)

Chapman, J.N., McVitie, S. and Hefferman, S.J. (1991) Mapping induction distributions by transmission electron microscopy (invited). Journal of Applied Physics, 69(8), pp. 6078-6083. (doi:10.1063/1.347775)

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Abstract

The Foucault and differential phase contrast modes of transmission electron microscopy are described and their uses for mapping induction distributions in magnetic thin films compared. The former is simpler to implement but the latter can provide quantitative information to much higher spatial resolution. Examples are given of instances where each is most suitable. Foucault images recorded during in situ magnetizing experiments provide valuable information on the magnetization process in small regular particles while the detailed magnetization distribution close to walls in soft magnetic films is best investigated using modified differential phase contrast microscopy.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:McVitie, Professor Stephen and Chapman, Professor John
Authors: Chapman, J.N., McVitie, S., and Hefferman, S.J.
College/School:College of Science and Engineering
College of Science and Engineering > School of Physics and Astronomy
Journal Name:Journal of Applied Physics
Publisher:American Institute of Physics
ISSN:0021-8979
ISSN (Online):1089-7550

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