Instrumentation, techniques, and applications of electron microscopy in the solid state physics group at Glasgow university

Craven, A.J., McVitie, S. and Chapman, J.N. (1993) Instrumentation, techniques, and applications of electron microscopy in the solid state physics group at Glasgow university. Microscopy Research and Technique, 24(4), pp. 316-332. (doi:10.1002/jemt.1070240405) (PMID:8513173)

Full text not currently available from Enlighten.

Abstract

This review discusses some of the work performed by the Solid State Physics Group at Glasgow University. A major aim of the group is to obtain quantitative information with high spatial resolution and to do this reliably requires a thorough understanding of both the instrumentation and the interactions between the electron beam and the specimen. Thus the first part of the review discusses those aspects of instrumentation and techniques that the group has considered in detail while the final part deals with applications which involve the study of a wide range of materials covering metallurgical, semiconductor, organic, and magnetic systems. In all these applications, the results from a range of techniques have been required to provide as complete a picture of the material as possible.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:McVitie, Professor Stephen and Craven, Professor Alan and Chapman, Professor John
Authors: Craven, A.J., McVitie, S., and Chapman, J.N.
College/School:College of Science and Engineering
College of Science and Engineering > School of Physics and Astronomy
Journal Name:Microscopy Research and Technique
Publisher:Wiley-Liss Inc.
ISSN:1059-910X
ISSN (Online):1097-0029

University Staff: Request a correction | Enlighten Editors: Update this record