Magnetic stray fields of Co-Cr microstrips measured by Lorentz microscopy

te Lintelo, J.G.T., Lodder, J.C., McVitie, S. and Chapman, J.N. (1994) Magnetic stray fields of Co-Cr microstrips measured by Lorentz microscopy. Journal of Applied Physics, 75(6), pp. 3002-3007. (doi:10.1063/1.356166)

Full text not currently available from Enlighten.

Abstract

Magnetic stray fields of Co‐Cr microstrips are investigated for bit stabilization in a vertical Bloch line memory (VBLM). The stray fields were revealed using Lorentz force based Foucault and differential phase contrast (DPC) techniques in a transmission electron microscope. The assumed shape of the stray fields for VBLM use has been experimentally verified. Agreement between experiment and simulation is obtained.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:McVitie, Professor Stephen and Chapman, Professor John
Authors: te Lintelo, J.G.T., Lodder, J.C., McVitie, S., and Chapman, J.N.
College/School:College of Science and Engineering
College of Science and Engineering > School of Physics and Astronomy
Journal Name:Journal of Applied Physics
Journal Abbr.:J. Appl. Phys.
Publisher:American Institute of Physics
ISSN:0021-8979
ISSN (Online):1089-7550

University Staff: Request a correction | Enlighten Editors: Update this record