Magnetic force microscopy of soft magnetic materials

Valera, M.S., Tomlinson, S.L., Heydon, G.P., Farley, A.N., Hoon, S.R., Zhou, L., McVitie, S. and Chapman, J.N. (1996) Magnetic force microscopy of soft magnetic materials. Journal of Magnetism and Magnetic Materials, 157-58, pp. 555-556. (doi:10.1016/0304-8853(95)01064-5)

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Abstract

The magnetic force microscopy of soft magnetic materials is a challenge due to the perturbing effect of the tip stray field on the samples magnetisation. Ferromagnetic thin film tips have been characterised by Lorentz electron microscopy and the tips employed in the study of a permalloy magneto-resistive sensor. Residual domains in the permalloy were detected and the location of domain walls related to the presence of imperfections in the edge of the sensor.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:McVitie, Professor Stephen and Chapman, Professor John
Authors: Valera, M.S., Tomlinson, S.L., Heydon, G.P., Farley, A.N., Hoon, S.R., Zhou, L., McVitie, S., and Chapman, J.N.
College/School:College of Science and Engineering
College of Science and Engineering > School of Physics and Astronomy
Journal Name:Journal of Magnetism and Magnetic Materials
Publisher:Elsevier
ISSN:0304-8853

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