Valera, M.S., Tomlinson, S.L., Heydon, G.P., Farley, A.N., Hoon, S.R., Zhou, L., McVitie, S. and Chapman, J.N. (1996) Magnetic force microscopy of soft magnetic materials. Journal of Magnetism and Magnetic Materials, 157-58, pp. 555-556. (doi: 10.1016/0304-8853(95)01064-5)
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Abstract
The magnetic force microscopy of soft magnetic materials is a challenge due to the perturbing effect of the tip stray field on the samples magnetisation. Ferromagnetic thin film tips have been characterised by Lorentz electron microscopy and the tips employed in the study of a permalloy magneto-resistive sensor. Residual domains in the permalloy were detected and the location of domain walls related to the presence of imperfections in the edge of the sensor.
| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | McVitie, Professor Stephen and Chapman, Professor John |
| Authors: | Valera, M.S., Tomlinson, S.L., Heydon, G.P., Farley, A.N., Hoon, S.R., Zhou, L., McVitie, S., and Chapman, J.N. |
| College/School: | College of Science and Engineering College of Science and Engineering > School of Physics and Astronomy |
| Journal Name: | Journal of Magnetism and Magnetic Materials |
| Publisher: | Elsevier |
| ISSN: | 0304-8853 |
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